Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits

Standard:
Issued:
  • 2015-12-06
 
  • CURRENT
Publisher:
  • SAE International
Pages:
14
Scope:

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations.

This document focuses on the LLM wearout assessment process. It acknowledges that the ADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.

Rationale:

As microcircuit technology progresses, the risk of early wearout increases for aerospace users. The aerospace industry needs to have a standardized approach to analysis and testing for wearout, to ensure reliability of future products, without introducing competitive disadvantages to those who address the issue effectively.

History:
Standard Published Revision Status
ARP6338 2015-12-06 Latest Issued
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