Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods

Standard:
Issued:
  • 2016-10-30
 
  • HISTORICAL Access the latest revision: AS6171/2A
Publisher:
  • SAE International
Pages:
31
Scope:

This document describes the requirements of the following test methods for counterfeit detection of electronic components:

a. Method A: General External Visual Inspection (EVI), Sample Selection, and Handling

b. Method B: Detailed EVI

c. Method C: Testing for Remarking and Resurfacing

d. Method D: Surface Texture Analysis by SEM

NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.

Rationale:

Counterfeit electronic components frequently have external characteristics that may be used to identify them as suspect. Visual inspection by means of optical and scanning electron microscope (SEM) techniques requires well-defined processes in order to discern and document characteristics that are consistent with counterfeit parts..

History:
Standard Published Revision Status
AS6171/2A 2017-05-11 Latest Revised
2016-10-30 Historical Issued
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