Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

Standard:
Revised:
  • 2016-05-24
 
  • CURRENT
Publisher:
  • SAE International
Pages:
17
Scope:

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

Rationale:

The technical revisions to this standard include updating the description of the IC test printed circuit board and providing for larger size test boards to accommodate larger IC packages. References and background information have also been updated.

History:
Standard Published Revision Status
J1752/1_201605 2016-05-24 Latest Revised
2006-10-13 Historical Revised
1997-03-01 Historical Issued
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