Test Device Head Contact Duration Analysis

Standard:
Reaffirmed:
  • 2005-12-14
 
Publisher:
  • SAE International
Pages:
5
Scope:

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

History:
Standard Published Revision Status
J2052_201607 2016-07-12 Latest Stabilized
2011-01-05 Historical Revised
2005-12-14 Historical Reaffirmed
1997-12-01 Historical Revised
1990-03-01 Historical Issued
Access
Now
SAE MOBILUS Subscriber? You may already have access.
Buy
Select
Price
List
Download
$76.00
Add
Mail
$76.00
Members save up to 18% off list price.
Grade
If you are currently using this technical report:
Share
HTML for Linking to Page
Page URL

Related Items

Article
2017-01-11
Technical Paper / Journal Article
2010-10-19
Training / Education
2017-10-27
Training / Education
2018-04-10
Training / Education
2013-02-20