Test Device Head Contact Duration Analysis

Product Code: J2052

Revision Number: A
Date Published: 2011-01-05

Issuing Committee:

Safety Test Instrumentation Stds Comm

Scope

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Product Status: In Stock

File Size: 57K

Purchase more ground vehicle standards and save! J-Paks offers a customized subscription plan that lets you pay for just the documents that you need, when you need them. Learn more >

Current & Historical versions of this standard
Standard	Date published	?Status
J2052_201101	2011-01-05	Revised
J2052_200512	2005-12-14	Reaffirmed
J2052_199712	1997-12-01	Revised
J2052_199003	1990-03-01	Issued

To see your exact member discounted price, log in now.

Delivery Method	List Price	Member Price*	Add to Cart
Download	$66.00	$52.80-$59.40	Add
Mail	$66.00	$52.80-$59.40	Add
Fax	$66.00	$59.40	Add

*The appropriate SAE Member discount will be applied through the Shopping Cart process. Discounts vary according to level of membership:
Elite Member 20%
Premium Member 15%
Classic Member 10%

Information on:
Download | Mail/Post | Fax
DRM Security | Copyright & Usage

Learn more about the Digital Rights Management Security available on all downloaded pdf documents.

If you are currently using this technical report and would like to provide feedback, please complete the SAE Standards User Feedback Form >

Test Device Head Contact Duration Analysis

Issuing Committee:

Scope

Related Content

Collections

Papers

Books

Standards