Test Device Head Contact Duration Analysis(STABILIZED Jul 2016)

Standard:
Stabilized:
  • 2016-07-12
 
  • CURRENT
Publisher:
  • SAE International
Pages:
7
Scope:

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Rationale:

This document is based on based on laws of physics and basic stable technology which is not dynamic in nature.

History:
Standard Published Revision Status
J2052_201607 2016-07-12 Latest Stabilized
2011-01-05 Historical Revised
2005-12-14 Historical Reaffirmed
1997-12-01 Historical Revised
1990-03-01 Historical Issued
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