Characterization, Conducted Immunity.

Scope:

The methods included in this document are: a. Voltage-Temperature Design Margins. b. Voltage Interruptions and Transients. c. Voltage Dropouts and Dips. d. Current Draw Under a Number of Conditions. e. Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).

Rationale:

This revision includes corrections, clarifications and simplifications from July 2007 version, deletion of some tests (transient B1, B2) and addition of transient A2-a and reference to new version of SAE J1211.

History:
Standard Published Revision Status
J2628_201307 2013-07-16 Latest Revised
2007-07-19 Historical Revised
2005-04-29 Historical Revised
2002-08-05 Historical Issued
Buy
Select
Price
List
Download
$70.00
Add
Mail
$70.00
Members save up to 20% off list price.
Grade
If you are currently using this technical report:
Share
HTML for Linking to Page
Page URL

Related Items

Article
2014-03-27
Training / Education
2014-11-06
Technical Paper
1996-02-01
Technical Paper
1972-02-01
Book
1996-01-01
Article
2013-11-26