Technique for Suspect/Counterfeit EEE Parts Detection by Secondary Ion Mass Spectrometry (SIMS) Test Method

Scope:

To define capabilities and limitations of SIMS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SIMS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the SIMS Test Method as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to: Option 1: All AS6171/13 Test Methods, or Option 2: All AS6171/13 Test Methods except imaging and 3D imaging, or Option 3: All AS6171/13 Test Methods except depth profiling and 3D imaging. If SAE AS6171/13 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

Rationale:

This document is intended to provide guidance for those unfamiliar with SIMS towards its use for detection of counterfeit EEE parts. Additionally it is intended to provide guidelines for the application of SIMS for operators and end users of the technique and to define the compliance requirements for laboratories using this technique.

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