Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Photoelectron Spectroscopy (XPS) Test Method

Scope:

To define capabilities and limitations of X-Ray Photoelectron Spectroscopy (XPS) as it pertains to detection of suspect/counterfeit EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of XPS including: operator training and requirements; sample preparation; data interpretation; and data reporting procedures.

Rationale:

This document is intended to provide guidance for those unfamiliar with XPS towards its use for detection of counterfeit EEE parts. Additionally it is intended to provide guidelines for the application of XPS for operators and end users of the technique and to define the compliance requirements for laboratories using this technique.

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