Technique for Suspect/Counterfeit EEE Parts Detection by Scanning Electron Microscopy (SEM) including Energy Dispersive X-Ray Spectroscopy Test Methods

Scope:

To define capabilities and limitations of SEM-EDS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SEM-EDS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. If SAE AS6171/22 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

Rationale:

This document is intended to provide guidelines for the application of SEM-EDS for operators and end users of the technique and to define the compliance requirements for laboratories using this technique towards its use for detection of counterfeit electrical, electronic and electromechanical (EEE) parts. Additionally, It is intended to provide guidance for those unfamiliar with SEM-EDS.

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