Techniques for Suspect/Counterfeit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods

Scope:

Through the use of ultra-high frequency ultrasound, typically above 10 MHz, Acoustic Microscopy (AM) non-destructively finds and characterizes physical features and latent defects (visualization of interior features in a layer by layer process) - such as material continuity and discontinuities, sub-surface flaws, cracks, voids, delaminations and porosity. AM observed features and defects can be indicators that the components were improperly handled, stored, altered or previously used.

If AS6171/6 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.

Rationale:

This document provides guidance and requirements on the Acoustic Microscopy (AM) test procedures to be employed by the Test Laboratory (Lab) for the non-destructive AM testing of parts for suspect counterfeit (SC) part detection. This revision adds Capacitors and other Electronic devices to the Acoustic Microscopy TM. This will expand the scope beyond just Plastic Encapsulated Microcircuits (PEMs) for Acoustic Microscopy testing.

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